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논문 유사도에 따라 DBpia 가 추천하는 논문입니다. 함께 보면 좋을 연관 논문을 확인해보세요!
Influence of O₂ Annealing on Electrical Characteristics of Atomic Layer Deposited HfO₂ thin Films on Si Substrate
한국진공학회 학술발표회초록집
2018 .08
Effect of Post Deposition Annealing in N₂ Ambient on Electrical Properties of Atomic Layer Deposited HfO₂ Films on Si
한국진공학회 학술발표회초록집
2018 .08
Effects of N₂ Anneal on Electrical Properties of HfO₂ Film on Si Substrate
한국진공학회 학술발표회초록집
2018 .02
Influence of O₂ Anneal on the Electrical Properties of HfO₂ thin Film on Si Substrate
한국진공학회 학술발표회초록집
2018 .02
Frequency Varied Capacitance-Voltage Characteristics of Al/HfO₂/Si Capacitors
한국진공학회 학술발표회초록집
2018 .08
Effect of Annealing Temperature and Annealing Time on Electrical Properties of HfZrO₄ Dielectric
한국진공학회 학술발표회초록집
2019 .08
Electrical Characteristics Comparison of Amorphous Indium Gallium Zinc Oxide (a-IGZO) According to Various Annealing Ambient
한국진공학회 학술발표회초록집
2018 .08
Improved Electrical and Optical Characteristics of Sol-Gel Processed ITO Thin Films Using Low Thermal Budget Microwave Annealing
한국진공학회 학술발표회초록집
2018 .08
Characteristics of low-temperature at 80°C HfO2 deposited by ALD (Atomic Layer Deposition) and electrical properties of NMOS capacitor
한국진공학회 학술발표회초록집
2019 .08
Effects of Annealing Temperature on Capacitance-Voltage Characteristics of Al/HfO2/Ge Capacitors
한국진공학회 학술발표회초록집
2018 .08
Impact of impurities and annealing conditions on the characteristics of Si/HfO₂:Al/TiN ReRAM devices
한국진공학회 학술발표회초록집
2020 .02
H₂O₂ effects of HfO₂ dielectric layers
한국진공학회 학술발표회초록집
2017 .02
Analysis on interface trap density of MOS capacitor with Al-doped HfO₂ insulation layer
한국진공학회 학술발표회초록집
2020 .02
Effect of Underlayer, CoFeB Composition and Annealing Temperature on Perpendicular Magnetic Anisotropy of CoFeB
한국자기학회 학술연구발표회 논문개요집
2021 .07
A Study on Optimized Calcination Technique for Improving Electrical Properties of In-Ga-Zn-O nanofiber
한국진공학회 학술발표회초록집
2018 .08
Annealing Temperature Effect on Al/ HfO₂/ InP capacitors
한국진공학회 학술발표회초록집
2020 .02
The Investigation on the Instability of Amorphous-Oxide-Semiconductor Thin-Film-Transistors Annealed by Conventional Thermal annealing and Microwave Irradiation
한국진공학회 학술발표회초록집
2015 .02
The Impacts of Various Susceptors in Microwave Annealing forIndium-Tin-OxideThinFilms
한국진공학회 학술발표회초록집
2018 .02
Electrical Characteristics in Field-Cycling of Zr:HfO₂ and Si:HfO₂ Ferroelectric Capacitors by First-order reversal curve diagram
한국진공학회 학술발표회초록집
2019 .08
Electrical properties of solution processed HfO₂ gate dielectrics at low temperature
한국진공학회 학술발표회초록집
2016 .08
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