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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2020.1
- 수록면
- 239 - 245 (7page)
이용수
초록· 키워드
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The digital image correlation method is useful and widely used to measure the deformation of thin film materials for mechanical testing and provides full-field deformation of the specimen. The accuracy and precision of the digital image correlation method depends on the quality of the image obtained during the test. The noise included in the digital image causes errors in the calculated displacement results. Strain is calculated by differentiating the displacement, so the effect of noise is amplified in the calculated result of strain. Therefore, noise is one of the most important factors in measuring displacement using images. In order to evaluate the effect of noise, one hundred images were taken continuously in a stationary state and the distribution of the local strain was calculated using digital image correlation. If the size of the subset is greater than 15×15pixel, the calculated results for strain show that the effect of noise is within the maximum error range of 1% and the standard deviation is 0.11% or less.
목차
등록된 정보가 없습니다.
참고문헌 (7)
참고문헌 신청
Tsuchiya, T. / 1998 / Specimen Size Effect on Tensile Strength of Surface Micro machined Polycrystalline Silicon Thin Films / J Microelectromech Syst 7:106~113
Greek, S. / 1999 / Micro Characterization of Thick Polysilicon Films : Young's Modulus and Fracture Strength Evaluated with Microstructure / J Micromech Microeng 9:245~251
Sharpe, W. N. / 1997 / A New Technique for Measuring the Mechanical Properties of Thin Films / J Microelectromech Syst 6:193~199
Kim, C. Y. / 2009 / Development of a Fatigue Testing System for Thin Films / Int J Fatigue 31:736~742
Pan, B. / 2009 / Two-dimensional Digital Image Correlation for In-plane Displacement and Strain Measurement : A Review / Meas Sci Technol 20:1~17
Greek, S. / 1999 / Micro Characterization of Thick Polysilicon Films : Young's Modulus and Fracture Strength Evaluated with Microstructure / J Micromech Microeng 9:245~251
Sharpe, W. N. / 1997 / A New Technique for Measuring the Mechanical Properties of Thin Films / J Microelectromech Syst 6:193~199
Kim, C. Y. / 2009 / Development of a Fatigue Testing System for Thin Films / Int J Fatigue 31:736~742
Pan, B. / 2009 / Two-dimensional Digital Image Correlation for In-plane Displacement and Strain Measurement : A Review / Meas Sci Technol 20:1~17
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